Published October 1995
| Version v1
Journal article
Investigation of radiative properties of plasma objects by methods of X-ray image spectroscopy
Creators
- 1. Vserossijski j Nauchno-Issledovatel'skij Inst. Fiziko-Tekhnicheskikh i Radiometricheskikh Izmerenij, Mendeleevo (Russian Federation)
- 2. Moskovskij Gosudarstvennyj Tekhnicheskij Univ. im. N. Eh. Baumana, Moscow (Russian Federation)
- 3. RAN, Fizicheskij Inst. im. P. N. Lebedeva, Moscow (Russian Federation)
Description
Emergence of a new class of x ray spectral devices, namely, image x ray spectroscopy devices, comprising high-luminosity spectrographs with spherical crystals, transmitting diffractional obscure lattices, and multilayer Bragg-Fresnel lenses, expands substantially the capabilities of high-temperature plasma experimental spectroscopy. It is shown that application of these devices in plasma diagnostics gives information about one- and two-dimensional spatial distribution of parameters of both nonhomogeneous plasma microobjects (micropinches, dense laser plasma regions) and extended plasma sources in the regions of their low luminosity (scattering laser plasma at large distances from the target). 61 refs., 23 figs., 7 tabs
Additional details
Additional titles
- Original title (Russian)
- Исследование радиационных свойств плазменных об
Publishing Information
- Journal Title
- Zhurnal Ehksperimental'noj i Teoreticheskoj Fiziki
- Journal Volume
- 108
- Journal Issue
- 4
- Journal Page Range
- p. 1263-1308.
- ISSN
- 0044-4510
- CODEN
- ZETFA7
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 27052648
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ALUMINIUM IONS; BRAGG REFLECTION; COPPER IONS; CRYSTALLOGRAPHY; DIFFRACTION GRATINGS; ELECTRON DENSITY; ELECTRON TEMPERATURE; EMISSION SPECTRA; ENERGY LEVELS; FRESNEL LENS; HEAVY IONS; HOT PLASMA; IMAGES; LASER-PRODUCED PLASMA; LONGITUDINAL PINCH; MAGNESIUM IONS; MOLYBDENUM IONS; MULTICHARGED IONS; PLASMA DIAGNOSTICS; SILICON IONS; SPATIAL RESOLUTION; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; IONS; LENSES; PINCH EFFECT; PLASMA; REFLECTION; RESOLUTION; SCATTERING; SPECTRA; SPECTROSCOPY