Published January 5, 2015
| Version v1
Journal article
Electrical conductivity of reconstructed Si(111) surface with sodium-doped C60 layers
Creators
- 1. School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950 (Russian Federation)
- 2. Institute of Automation and Control Processes, FEB RAS, Vladivostok 690041 (Russian Federation)
- 3. Department of Electronics, Vladivostok State University of Economics and Service, Vladivostok 690600 (Russian Federation)
Description
Electrical conductance of sodium-doped C60 ultra-thin layers (1–6 monolayers) grown on the Na-adsorbed Si(111)√3 × √3-Au surface has been studied in situ by four-point probe technique, combined with low-energy electron diffraction observations. Evidence of conductance channel formation through the C60 ultrathin layer is demonstrated as a result of Na dosing of 3 and 6 monolayers thick C60 layers. The observed changes in surface conductivity can be attributed to the formation of fulleride-like NaC60 and Na2C60 compound layers
Additional details
Identifiers
- DOI
- 10.1063/1.4905288;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 106
- Journal Issue
- 1
- Journal Page Range
- p. 011603-011603.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46101334
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTAL STRUCTURE; DOPED MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRON DIFFRACTION; FULLERENES; GOLD; LAYERS; PROBES; SILICON; SODIUM; SURFACES; THIN FILMS
- Descriptors DEC
- ALKALI METALS; CARBON; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; MATERIALS; METALS; NONMETALS; PHYSICAL PROPERTIES; SCATTERING; SEMIMETALS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC