Published July 2008 | Version v1
Journal article

Depth profiling of Mg by 2010 keV resonance of 24Mg(p,p'γ)24Mg nuclear reaction

  • 1. National Centre for Compositional Characterization of Materials, BARC, ECIL Post, Hyderabad 500062 (India)
  • 2. Water and Steam Chemistry Division, BARC, Kalapakkam, TN 603102 (India)

Description

Studies on the characteristics of 2010 keV resonance in 24Mg(p,p'γ)24Mg nuclear reaction for depth profiling Mg in thin films are reported. The resonance reaction, based on the detection of characteristic 1368 keV γ-rays, enables interference free measurement of Mg down to 2 x 1020 atoms/cm3 and has a probing depth of about 20 μm. The width of the resonance extracted from excitation curves for thick (>180 nm) thermally grown elemental Mg films, by SPACES is about 350 ± 50 eV. The reaction has been used to depth profile Mg in a Mg/Ti/Mg/Si film which provides interesting information on interfacial mixing involving Ti layer and the underlying Mg layer

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2008.03.237

Additional details

Identifiers

DOI
10.1016/j.nimb.2008.03.237;
PII
S0168-583X(08)00496-5;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
266
Journal Issue
14
Journal Page Range
p. 3281-3289
ISSN
0168-583X
CODEN
NIMBEU

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.