Particle lithography with vapor deposition of organosilanes: A molecular toolkit for studying confined surface reactions in nanoscale liquid volumes
- 1. Department of Chemistry and the Center for BioModular Multi-Scale Systems, Louisiana State University, 232 Choppin Hall, Baton Rouge, LA, 70803 (United States)
- 2. Nanotechnology Measurements Division, Agilent Technologies, Inc., 4330 West Chandler Boulevard, Chandler, Arizona 85226 (United States)
Description
Combining particle lithography with molecular self-assembly provides a practical approach for producing 2D arrays of organosilane nanostructures with well-defined geometries and designated surface coverage. By combining heated chemical vapor deposition with particle lithography, the binding of organosilanes on substrates is narrowly confined to the locations of water residues surrounding the base of latex spheres. Localized meniscus sites of water designate specific locations for the hydrolysis and condensation reactions of organosilanes. With particle lithography, billions of regular nanopatterns can be generated with high throughput to provide exquisite nanoscale control of the geometry, density and surface coverage of organosilane nanostructures. In this report, examples of organosilane nanopatterns presenting different terminal groups and chain lengths are demonstrated with atomic force microscopy images. The effect of the terminal moieties of organosilanes was investigated for nanostructures prepared by particle lithography by evaluating parameters of the number density, surface coverage and thickness of layers formed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.01.164Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.01.164;
- PII
- S0040-6090(11)00214-8;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 519
- Journal Issue
- 15
- Journal Page Range
- p. 5223-5229
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 5. international conference on technological advances of thin films and coatings
- Acronym
- Thin Films 2010
- Dates
- 12-14 Jul 2010
- Place
- Harbin (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43051859
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; CONTROL; HYDROLYSIS; LAYERS; LIQUIDS; NANOSTRUCTURES; PARTICLES; SUBSTRATES; SURFACES; THICKNESS; VAPORS
- Descriptors DEC
- CHEMICAL COATING; CHEMICAL REACTIONS; DECOMPOSITION; DEPOSITION; DIMENSIONS; FLUIDS; GASES; LYSIS; MICROSCOPY; SOLVOLYSIS; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.