Published May 31, 2011 | Version v1
Journal article

Particle lithography with vapor deposition of organosilanes: A molecular toolkit for studying confined surface reactions in nanoscale liquid volumes

  • 1. Department of Chemistry and the Center for BioModular Multi-Scale Systems, Louisiana State University, 232 Choppin Hall, Baton Rouge, LA, 70803 (United States)
  • 2. Nanotechnology Measurements Division, Agilent Technologies, Inc., 4330 West Chandler Boulevard, Chandler, Arizona 85226 (United States)

Description

Combining particle lithography with molecular self-assembly provides a practical approach for producing 2D arrays of organosilane nanostructures with well-defined geometries and designated surface coverage. By combining heated chemical vapor deposition with particle lithography, the binding of organosilanes on substrates is narrowly confined to the locations of water residues surrounding the base of latex spheres. Localized meniscus sites of water designate specific locations for the hydrolysis and condensation reactions of organosilanes. With particle lithography, billions of regular nanopatterns can be generated with high throughput to provide exquisite nanoscale control of the geometry, density and surface coverage of organosilane nanostructures. In this report, examples of organosilane nanopatterns presenting different terminal groups and chain lengths are demonstrated with atomic force microscopy images. The effect of the terminal moieties of organosilanes was investigated for nanostructures prepared by particle lithography by evaluating parameters of the number density, surface coverage and thickness of layers formed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2011.01.164

Additional details

Identifiers

DOI
10.1016/j.tsf.2011.01.164;
PII
S0040-6090(11)00214-8;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
519
Journal Issue
15
Journal Page Range
p. 5223-5229
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
5. international conference on technological advances of thin films and coatings
Acronym
Thin Films 2010
Dates
12-14 Jul 2010
Place
Harbin (China)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43051859
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; CONTROL; HYDROLYSIS; LAYERS; LIQUIDS; NANOSTRUCTURES; PARTICLES; SUBSTRATES; SURFACES; THICKNESS; VAPORS
Descriptors DEC
CHEMICAL COATING; CHEMICAL REACTIONS; DECOMPOSITION; DEPOSITION; DIMENSIONS; FLUIDS; GASES; LYSIS; MICROSCOPY; SOLVOLYSIS; SURFACE COATING

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.