Published 1988
| Version v1
Book
Sintering of silcon carbide prepared from a polymeric precursor
- 1. Massachusetts Inst. of Tech., Cambridge, MA (USA). Ceramics Processing Research Lab.
- 2. BP America Research and Development, Cleveland, OH (USA)
Description
A polysilane precursor to SiC was doped with 0, 0.5, and 2 wt% B4C powder and heated to 1000, 1900, 2000, and 2100 degrees C. Chemical and structural characteristics of the intermediate and final products were investigated using chemical analysis, x-ray powder diffraction, and scanning electron microscopy. Residue densification promoted by boron carbide exceeded 90% of theoretical, similar to boron-enhanced sintering of silicon carbide powder. The polymer residue contained ∼ 19 wt% excess carbon which crystallized at the sintering temperatures. These results are applicable to polysilane polymers both as binders for silicon carbide powders and as precursors to thermally stable fibers
Additional details
Publishing Information
- Publisher
- American Ceramic Society Inc.
- Imprint Place
- Columbus, OH (USA)
- ISBN
- 0-916094-31-6
- Imprint Title
- Ceramic transactions
- Imprint Pagination
- 1207 p.
- Journal Page Range
- p. 856-863.
Conference
- Title
- 1. international conference on ceramic powder processing sciences.
- Dates
- 1-4 Nov 1987.
- Place
- Orlando, FL (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21070475
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BINDERS; BORON CARBIDES; CHEMICAL REACTION YIELD; CRYSTAL DOPING; FIBERS; MICROSTRUCTURE; POWDERS; SCANNING ELECTRON MICROSCOPY; SILANES; SILICON CARBIDES; SINTERING; TEMPERATURE DEPENDENCE; VERY HIGH TEMPERATURE; X-RAY DIFFRACTION
- Descriptors DEC
- BORON COMPOUNDS; CARBIDES; CARBON COMPOUNDS; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; FABRICATION; HYDRIDES; HYDROGEN COMPOUNDS; MICROSCOPY; SCATTERING; SILICON COMPOUNDS
Optional Information
- Secondary number(s)
- CONF-8711115--.