Published February 2024
| Version v1
Journal article
Most suitable X-ray detection technology for automated X-ray inspection
Description
This paper introduces AXI (automated X-ray inspection) based on a radiation resistance enhanced CMOS (complementary metal oxide sensor) developed for use in industrial NDT (non-destructive testing). It also introduces detector technology trends in medical industry with has a larger market size than NDT, both of which belong to the same category in detecting X-rays, and the CT inspection of electric vehicle batteries. (A.O.)
Abstract (Japanese)
本稿では、自動X線検査における検出技術において、技術開発の歴史を辿り現在のプリント基板製造の自動検査において最適なディテクタ技術を紹介する。(著者)Additional details
Additional titles
- Original title (Japanese)
- 自動X線検査に最適なX線検出技術
Publishing Information
- Journal Title
- Kensa Gijutsu
- Journal Volume
- 29
- Journal Issue
- 2
- Series
- 雑誌名:検査技術
- Journal Page Range
- p. 49-56
- ISSN
- 1342-9825
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 55074612
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- AUTOMATION; CESIUM IODIDES; CMOS CIRCUITS; DEFECTS; ELECTRIC BATTERIES; FIBER OPTICS; IMAGES; INSPECTION; PACKAGING; PHOTON COMPUTED TOMOGRAPHY; PRINTED CIRCUITS; RADIATION HARDNESS; SEMICONDUCTOR DETECTORS; X-RAY DETECTION; X-RAY RADIOGRAPHY
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CESIUM COMPOUNDS; CESIUM HALIDES; COMPUTERIZED TOMOGRAPHY; DETECTION; DIAGNOSTIC TECHNIQUES; ELECTROCHEMICAL CELLS; ELECTRONIC CIRCUITS; ENERGY STORAGE SYSTEMS; ENERGY SYSTEMS; HALIDES; HALOGEN COMPOUNDS; INDUSTRIAL RADIOGRAPHY; INORGANIC PHOSPHORS; INTEGRATED CIRCUITS; IODIDES; IODINE COMPOUNDS; MATERIALS TESTING; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; NONDESTRUCTIVE TESTING; OPTICS; PHOSPHORS; RADIATION DETECTION; RADIATION DETECTORS; TESTING; TOMOGRAPHY
Optional Information
- Notes
- 8 figs., 1 tab., 3 photos