Published July 2011
| Version v1
Journal article
Transient spectroscopy of Ryvkin's α centers
Creators
- 1. National Academy of Sciences of Belarus, Institute of Technical Acoustics (Belarus)
Description
The features of the DLTS detection of defects with retrappability of thermally excited carriers due to a large value of effective capture cross section are considered. Indications allowing identification of the implementation of the given model are found.
Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 45
- Journal Issue
- 7
- Journal Page Range
- p. 857-860
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43094886
- Subject category
- S42: ENGINEERING; S36: MATERIALS SCIENCE;
- Descriptors DEI
- CROSS SECTIONS; DEEP LEVEL TRANSIENT SPECTROSCOPY; DEFECTS; DETECTION; TRANSIENTS
- Descriptors DEC
- SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2011 Pleiades Publishing, Ltd.