Published March 1991 | Version v1
Journal article Metadata-only

Properties of Josephson tunnel junction with trapped Abrikosov vortices

Creators

  • 1. Institute of Radioengineering and Electronics of the USSR, Academy of Sciences, Marx Avenue 18, Moscow 103907 (USSR)
  • 2. Moscow Steel and Alloys Inst., Lenin Avenue 4, Moscow 117936 (USSR)

Description

This paper investigates properties of the Nb/AlOx/Nb Josephson tunnel juncton (JTJ) with Abrikosov vortices (AV) trapped in electrodes. The trapping of AV was performed by a field-cooling process when the JTJ has been cooled through the critical temperature T either in applied perpendicular magnetic field (Bperpendicular) (mode 1) or by application of the perpendicular magnetic field Bperpendicular when the JTJ was at the temperature below Tc (mode 2). The effect of AV on dependences of Josephson critical supercurrent Ic in the parallel magnetic field B parallel has been studied

Additional details

Additional titles

Subtitle (English)
Physical aspects and application for registration of alpha-particles

Publishing Information

Journal Title
IEEE Transactions on Magnetics
Journal Volume
27
Journal Issue
2
Series
IEEE Trans. Magn.
Journal Page Range
3280-3283
ISSN
0018-9464
CODEN
IEMGA

Conference

Title
1990 applied superconductivity conference.
Dates
24-28 Sep 1990.
Place
Snowmass, CO (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
23021053
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABRIKOSOV THEORY; ALPHA DETECTION; ALPHA PARTICLES; ALPHA SPECTROMETERS; ALUMINIUM OXIDES; CRITICAL CURRENT; CRITICAL TEMPERATURE; ELECTRODES; JOSEPHSON JUNCTIONS; LAYERS; MAGNETIC FIELDS; NIOBIUM; PERFORMANCE; SUPERCONDUCTIVITY; TRAPPING; TUNNEL EFFECT; VORTICES
Descriptors DEC
ALUMINIUM COMPOUNDS; CHALCOGENIDES; CHARGED PARTICLE DETECTION; CHARGED PARTICLES; CURRENTS; DETECTION; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELEMENTS; HELIUM IONS; IONIZING RADIATIONS; IONS; MEASURING INSTRUMENTS; METALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATION DETECTION; RADIATIONS; SEMICONDUCTOR JUNCTIONS; SPECTROMETERS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS; TRANSITION TEMPERATURE

Optional Information

Secondary number(s)
CONF-900944--.