Image system of X-ray fluorescence based on detectors Thick-GEM

GEMs (Gas Electron Multiplier) and Thick-GEMs (Thick-Gas Electron Multiplier) are MPGDs (Micropattern Gas Detector) that make part of the new generation of gaseous detectors, allowing high counting rates, low cost when compared to solid state detectors, high radiation hardness and gain when using multiple structures. Besides that, the handling and maintenance of these detectors is relatively simple, being versatile to detect different types of radiation. Therefore, these detectors are an effective alternative to build imaging systems with large sensitive area. This work consists in the study and characterization of a set of gaseous detectors, more specifically the Thick-GEMs produced in the High Energy Physics and Instrumentation Center at IFUSP, which were tested showing promising results in terms of gain, energy resolution and operational stability. However, due to the low signal-to-noise ratio of the Thick-GEMs, the X-ray fluorescence imaging system was mounted using GEMs. During this work the necessary software tools for image processing and reconstruction were developed as a parallel study in computational simulations to better understand the operation of gaseous detectors. X-ray fluorescence techniques are essential in areas such as medicine and the study of historical and cultural heritage since they are non-invasive and non-destructive. Techniques to check the authenticity of masterpieces are required and museums are gradually becoming more interested in the Physics and instrumentation needed to characterize their patrimony. (author)