Published April 1, 1976 | Version v1
Journal article Metadata-only

Correlation between critical temperature and other electrical properties for thin tantalum films

Creators

  • 1. Physics Department, University of Aston, Birmingham B4 7ET, England

Description

Measurements on thin tantalum films prepared by evaporation in ultrahigh vacuum show definite correlation between the critical temperature (T/subc/) and resistivity ratio (rho300/rho10). Empirical relationships are given for films having resistivity ratios in the range 1.2--6 corresponding to a thickness range 11x5--965 nm

Additional details

Identifiers

DOI
10.1063/1.88779;

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
28
Journal Issue
7
Series
Appl. Phys. Lett.
Journal Page Range
410-410
ISSN
0003-6951

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
7259754
Subject category
S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
FILMS; PHONONS; SUPERCONDUCTIVITY; TANTALUM; TEMPERATURE DEPENDENCE; THICKNESS; TRANSITION TEMPERATURE
Descriptors DEC
DIMENSIONS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; METALS; PHYSICAL PROPERTIES; QUASI PARTICLES; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS

Optional Information

Notes
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