Self-consistent PIC simulations of ultimate space charge compensation with electron lenses
Creators
- 1. Fermilab, Batavia, IL, 60510 (United States)
Description
Further progress of fundamental particle physics requires high intensity and high brightness of accelerated proton and ion beams. This goal is essential for the FAIR hadron beams at GSI, for the neutrino production at the facilities such as Fermilab and JPARC, and for the Large Hadron Collider luminosity at CERN. One of the most formidable obstacles toward that goal is the beam's own space charge, whose forces cause beam emittance growth, losses and lifetime degradation. Typically, such effects become intolerable when the space charge tune-shift parameter Δ QSC exceeds ∼ - (0.25–0.5). To reduce these detrimental effects, it was suggested to use electron lenses to compensate the space charge forces. This paper reports on detailed particle-in-cell space charge and electron lens compensation simulations for extremely intense proton bunches whose space charge tune-shift parameter exceeds -1.0. Different scenarios were evaluated based on reduction in the emittance growth and particle loss at a 4σ aperture. We investigate phenomena and issues related to the focusing lattice errors, importance of the transverse and longitudinal matching of the electron beam profiles to the proton ones, and vary the strength and the number of the electron lenses distributed around a circular machine to optimize the reduction of harmful space charge effects. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/16/03/P03045Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 16
- Journal Issue
- 03
- Journal Page Range
- [14 p.]
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53071685
- Subject category
- S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAM EMITTANCE; BEAM PROFILES; BRIGHTNESS; CERN LHC; ELECTRON BEAMS; FERMILAB; ION BEAMS; LENSES; PARTICLE LOSSES; PARTICLE PRODUCTION; SIMULATION; SPACE CHARGE
- Descriptors DEC
- ACCELERATORS; BEAMS; CYCLIC ACCELERATORS; LEPTON BEAMS; LOSSES; NATIONAL ORGANIZATIONS; OPTICAL PROPERTIES; PARTICLE BEAMS; PHYSICAL PROPERTIES; STORAGE RINGS; SYNCHROTRONS; US DOE; US ORGANIZATIONS