Synthesis and Characterization of Filtered-cathodic-vacuum-arc-deposited TiO2 Films for Photovoltaic Applications
Creators
- 1. Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand)
- 2. Science and Technology Research Institute, Chiang Mai University, Chiang Mai 50200 (Thailand)
- 3. Thailand Center of Excellence in Physics, Commission on Higher Education, 328 Si Ayutthaya Road, Bangkok 10400 (Thailand)
- 4. Departments of General Science, Faculty of Science, Srinakharinwirot University, Bangkok 10110 (Thailand)
Description
Titanium dioxide (TiO2) is well-known as a photovoltaic and photocatalytic material. For improvement in the dye-sensitized solar cell (DSSC) performance efficiency, the photocatalyst TiO2 layer would be desired in nanoporous anatase. In this research, TiO2 films were synthesized on glass or p-type silicon substrate using our in-house Filtered Cathodic Vacuum Arc Deposition (FCVAD) system. The deposition was operated at varied oxygen (O2) partial pressures of 10−4, 10−3, 10−2 to 10−1 torr with fixed 0 or 250-V bias and 600-V arc for 10 or 20 minutes. The film transparency increased with increasing of the O2 pressure, indicating increase in the structure required for applications in dye-sensitized solar cells. The films were characterized using the Energy-Dispersive X-ray spectroscopy (EDS) and Raman spectroscopy techniques. The EDS confirmed that the transparent deposited films contained stoichiometric titanium and oxygen under the medium O2 pressure. Raman spectra confirmed that the films were TiO2 containing some rutile but no anatase which needed annealing to form. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) were used for evaluation of the film's surface morphology and thickness. The result showed that increasing of the O2 pressure decreased the thickness to a nanoscale but increased the amount of TiO2.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/423/1/012005Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 423
- Journal Issue
- 1
- Journal Page Range
- [8 p.]
- ISSN
- 1742-6596
Conference
- Title
- 2013 international conference on science and engineering in mathematics, chemistry and physics
- Acronym
- ScieTech 2012
- Dates
- 24-25 Jan 2013
- Place
- Jakarta (Indonesia)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44119171
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; ATOMIC FORCE MICROSCOPY; FILMS; FILTERS; LAYERS; NANOSTRUCTURES; PHOTOVOLTAIC EFFECT; RAMAN SPECTRA; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON; SOLAR CELLS; STOICHIOMETRY; SUBSTRATES; SURFACES; SYNTHESIS; THICKNESS; TITANIUM OXIDES; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; DIMENSIONS; DIRECT ENERGY CONVERTERS; ELECTRON MICROSCOPY; ELEMENTS; EQUIPMENT; HEAT TREATMENTS; LASER SPECTROSCOPY; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRIC CELLS; PHOTOELECTRIC EFFECT; PHOTOVOLTAIC CELLS; SEMIMETALS; SOLAR EQUIPMENT; SPECTRA; SPECTROSCOPY; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS