Published January 1977 | Version v1
Journal article

Use of image restoration and enhancement to improve x-ray pinhole camera resolution

  • 1. Sandia Laboratories, Albuquerque, New Mexico 87115

Description

Numerical image processing techniques are applied to the restoration of x-ray pinhole photographs of solid targets irradiated by intense relativistic electron beams. The numerical and analytic bases for image restoration are briefly described. An experimentally determined point-spread function for the pinhole camera is utilized to eliminate the effects of high-energy x-ray degradation of pinhole resolution. It is shown that penetration by hard x rays from filtered spectra through the pinhole edges can lead to apparent broadening of the electron-beam pinch on high-Z targets. Elimination of x-ray shine-through also permits determination of photon intensity from high-Z target ablation products, and improves spatial resolution of the x-ray source

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
48
Journal Issue
1
Series
J. Appl. Phys.
Journal Page Range
398-405
ISSN
0021-8979

Optional Information

Notes
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