Use of image restoration and enhancement to improve x-ray pinhole camera resolution
Description
Numerical image processing techniques are applied to the restoration of x-ray pinhole photographs of solid targets irradiated by intense relativistic electron beams. The numerical and analytic bases for image restoration are briefly described. An experimentally determined point-spread function for the pinhole camera is utilized to eliminate the effects of high-energy x-ray degradation of pinhole resolution. It is shown that penetration by hard x rays from filtered spectra through the pinhole edges can lead to apparent broadening of the electron-beam pinch on high-Z targets. Elimination of x-ray shine-through also permits determination of photon intensity from high-Z target ablation products, and improves spatial resolution of the x-ray source
Additional details
Identifiers
- DOI
- 10.1063/1.323340;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 48
- Journal Issue
- 1
- Series
- J. Appl. Phys.
- Journal Page Range
- 398-405
- ISSN
- 0021-8979
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 8304525
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ABLATION; BEAM-PLASMA SYSTEMS; CAMERAS; ELECTRON BEAMS; IMAGES; IRRADIATION; PHOTOGRAPHY; PINCH EFFECT; RELATIVISTIC RANGE; RESOLUTION; X-RAY EMISSION ANALYSIS; X-RAY SOURCES; X-RAY SPECTRA
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; ENERGY RANGE; LEPTON BEAMS; NONDESTRUCTIVE ANALYSIS; PARTICLE BEAMS; RADIATION SOURCES; SPECTRA; X-RAY EQUIPMENT
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent