Quantitative analysis of chemical elements in single cells using nuclear microprobe and nano-probe
Description
The study of the role of trace elements at cellular level requires the use of state-of-the-art analytical tools that could achieve enough sensitivity and spatial resolution. We developed a new methodology for the accurate quantification of chemical element distribution in single cells based on a combination of ion beam analysis techniques STIM, PIXE and RBS. The quantification procedure relies on the development of a STIM data analysis software (Paparamborde). Validity of this methodology and limits are discussed here. The method allows the quantification of trace elements (μg/g) with a 19.8 % uncertainty in cellular compartments with mass below 0.1 ng. The main limit of the method lies in the poor number of samples that can be analyzed, due to long irradiation times required and limited access to ion beam analysis facilities. This is the reason why we developed a database for cellular chemical composition capitalization (BDC4). BDC4 has been designed in order to use cellular chemical composition as a tracer for biological activities and is expected to provide in the future reference chemical compositions for any cellular type or compartment. Application of the STIM-PIXE-RBS methodology to the study of nuclear toxicology of cobalt compounds is presented here showing that STIM analysis is absolutely needed when organic mass loss appears during PIXE-RBS irradiation. (author)
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Additional details
Additional titles
- Original title (French)
- Analyse chimique quantitative a haute resolution spatiale par microsonde et nanosonde nucleaires
Identifiers
Publishing Information
- Imprint Pagination
- 180 p.
- Report number
- FRNC-TH--9024
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 46034901
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Thesis
- Descriptors DEI
- ANIMAL CELLS; CHEMICAL COMPOSITION; COBALT COMPOUNDS; ION BEAMS; PIXE ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SENSITIVITY; SPATIAL RESOLUTION; TRACE AMOUNTS
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS; RESOLUTION; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 195 refs.; Available from the INIS Liaison Officer for France, see the 'INIS contacts' section of the INIS-NKM website for current contact and E-mail addresses: http://www.iaea.org/inis/Contacts/; Also available from Service Commun de la Documentation (SCD) Allee Baudrimont 33405 TALENCE Cedex (France)