Stability of the discretization of the electron avalanche phenomenon
- 1. Ricerca Sul Sistema Energetico (RSE), Via Rubattino 50, 20134, Milano (Italy)
- 2. CMIC Department "Giulio Natta", Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133, Milano (Italy)
Description
The numerical simulation of the discharge inception is an active field of applied physics with many industrial applications. In this work we focus on the drift-reaction equation that describes the electron avalanche. This phenomenon is one of the basic building blocks of the streamer model. The main difficulty of the electron avalanche equation lies in the fact that the reaction term is positive when a high electric field is applied. It leads to exponentially growing solutions and this has a major impact on the behavior of numerical schemes. We analyze the stability of a reference finite volume scheme applied to this latter problem. The stability of the method may impose a strict mesh spacing, therefore a proper stabilized scheme, which is stable whatever spacing is used, has been developed. The convergence of the scheme is treated as well as some numerical experiments
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jcp.2015.05.013Additional details
Identifiers
- DOI
- 10.1016/j.jcp.2015.05.013;
- PII
- S0021-9991(15)00341-1;
Publishing Information
- Journal Title
- Journal of Computational Physics
- Journal Volume
- 296
- Journal Page Range
- p. 369-381
- ISSN
- 0021-9991
- CODEN
- JCTPAH
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47035273
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S97: MATHEMATICAL METHODS AND COMPUTING;
- Descriptors DEI
- ADVECTION; AVALANCHE QUENCHING; COMPUTERIZED SIMULATION; CONVERGENCE; ELECTRIC FIELDS; ELECTRONS; EQUATIONS; NUMERICAL ANALYSIS
- Descriptors DEC
- ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MASS TRANSFER; MATHEMATICS; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.