Published February 15, 1978 | Version v1
Journal article

The measurement of pore size in porous and microporous materials using resonant ion beam backscattering

  • 1. Harwell Laboratory, Didcot, Oxon. UK

Description

Established methods for measuring the size of pores in porous materials include those of mercury porosimetry and gas adsorption. A disadvantage of these methods is that only one determination can be made for each prepared specimen. A property of the ion beam backscattering method is that each specimen can be probed over the surface and also as a function of depth. Furthermore for microporous samples (pore width less than 2 nm) mercury penetration methods cannot be used because the high pressures involved make unreasonable demands in terms of mechanical strength. At the same time gas adsoption techniques are considerably restricted because capillary condensation is no longer possible because of the small size of the pores. A description is given of the methods of calculation of pore size from resonant ion beam backscattering data, with various assumptions for the pore and interpore path length distributions. Examples are shown of results obtained with highly porous silica gels where good agreement with gas adsoption has been achieved. Finally, some results obtained by scanning silica gels of lower porosity are also given. (Auth.)

Additional details

Identifiers

Publishing Information

Journal Title
Nuclear Instruments and Methods
Journal Volume
149
Journal Issue
1-3
Series
Nucl. Instrum. Methods.
Journal Page Range
329-335
ISSN
0029-554X

Conference

Title
3. international conference on ion beam analysis.
Dates
27 Jun - 1 Jul 1977.
Place
Washington, D.C., USA.

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
9386545
Subject category
S42: ENGINEERING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALPHA BEAMS; ALPHA PARTICLES; BACKSCATTERING; ENERGY SPECTRA; ION SCATTERING ANALYSIS; MEV RANGE 01-10; POROSITY; POROUS MATERIALS; SILICA GEL; SIZE
Descriptors DEC
ADSORBENTS; BEAMS; CHARGED PARTICLES; CHEMICAL ANALYSIS; ENERGY RANGE; HELIUM IONS; HELIUM 4 BEAMS; ION BEAMS; IONS; MEV RANGE; NONDESTRUCTIVE ANALYSIS; SCATTERING; SPECTRA

Optional Information

Notes
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