Published December 15, 1984
| Version v1
Journal article
Atom (fast atom bombardment) compared to ion-induced static secondary ion mass spectrometry: evidence for charge-induced damage in insulators
- 1. Manchester Univ. (UK). Inst. of Science and Technology
Description
A comparison of the secondary ion mass spectra obtained and the surface damage caused by ion and atom bombardment of polystyrene and niobium pentoxide shows that ion bombardment causes significantly more disruption of the surface structure of low conductivity materials than does atom bombardment. (author)
Additional details
Publishing Information
- Journal Title
- J. Chem. Soc. (London), Chem. Commun.
- Journal Issue
- no.24
- Series
- J. Chem. Soc. (London), Chem. Commun.
- ISSN
- 0022-4936
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 16025373
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMIC BEAMS; ATOMS; ELECTRICAL INSULATORS; ION BEAMS; IONS; MASS SPECTRA; NIOBIUM OXIDES; POLYSTYRENE; RADIATION EFFECTS; SECONDARY EMISSION; SURFACE PROPERTIES
- Descriptors DEC
- BEAMS; CHALCOGENIDES; CHARGED PARTICLES; ELECTRICAL EQUIPMENT; EMISSION; EQUIPMENT; NIOBIUM COMPOUNDS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXIDES; OXYGEN COMPOUNDS; POLYMERS; POLYOLEFINS; POLYVINYLS; SPECTRA; TRANSITION ELEMENT COMPOUNDS