Detecting antiferromagnetism of atoms in an optical lattice via optical Bragg scattering
- 1. Department of Physics and Astronomy, and Rice Quantum Institute, Rice University, Houston, Texas 77005 (United States)
- 2. Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14853 (United States)
Description
Antiferromagnetism of ultracold fermions in an optical lattice can be detected by Bragg diffraction of light, in analogy to the diffraction of neutrons from solid-state materials. A finite sublattice magnetization will lead to a Bragg peak from the ((1/2)(1/2)(1/2)) crystal plane with an intensity depending on details of the atomic states, the frequency and polarization of the probe beam, the direction and magnitude of the sublattice magnetization, and the finite optical density of the sample. Accounting for these effects we make quantitative predictions about the scattering intensity and find that with experimentally feasible parameters the signal can be readily measured with a CCD camera or a photodiode and used to detect antiferromagnetic order.
Additional details
Identifiers
- DOI
- 10.1103/PhysRevA.81.013415;
- arXiv
- arXiv:0910.2450v1;
Publishing Information
- Journal Title
- Physical Review. A
- Journal Volume
- 81
- Journal Issue
- 1
- Journal Page Range
- p. 013415-013415.9
- ISSN
- 1050-2947
- CODEN
- PLRAAN
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41117500
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANTIFERROMAGNETISM; ATOMS; BEAMS; BRAGG CURVE; BRAGG REFLECTION; CAMERAS; CHARGE-COUPLED DEVICES; CRYSTALS; DIFFRACTION; FORECASTING; MAGNETIZATION; MATERIALS; NEUTRONS; OPACITY; POLARIZATION; VISIBLE RADIATION
- Descriptors DEC
- BARYONS; COHERENT SCATTERING; DIAGRAMS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; HADRONS; INFORMATION; MAGNETISM; NUCLEONS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; REFLECTION; SCATTERING; SEMICONDUCTOR DEVICES
Optional Information
- Notes
- (c) 2010 The American Physical Society