Published December 18, 2002 | Version v1
Journal article

Operation of the beam diagnostics system for tevatron electron lens

  • 1. PO Box 500, FNAL, Batavia, IL 60510 (United States)
  • 2. University of California at Los Angeles, P.O. Box 951547, Los Angeles, CA 90095-1547 (United States)

Description

The first Tevatron Electron Lens (TEL) has been installed and commissioned successfully as part of the Beam-Beam Compensation project at Fermilab. Currently it is operated routinely for DC beam cleaning during Tevatron luminosity stores and for advanced beam-beam studies. This paper reviews the electron and proton (antiproton) beam diagnostics, which allow us to measure beam intensity, waveform, losses, position, timing and profile. In addition, other proton (antiproton) diagnostics, available from the Tevatron control system, which are used for tuning beam parameters in the TEL (tune-shift, orbit, emittances, lifetime measurements, etc) are also described. We also present the results of measurements of the beam parameters and discussions for future upgrades

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
648
Journal Issue
1
Journal Page Range
p. 483-490
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
10. beam instrumentation workshop
Dates
6-9 May 2002
Place
Upton, NY (United States)

Optional Information

Notes
(c) 2002 American Institute of Physics