Thermal issues in Casimir forces between conductors and semiconductors
Creators
- 1. H. L. Dodge Department of Physics and Astronomy, University of Oklahoma, Norman, OK 73019 (United States)
- 2. Department of Energy and Process Engineering, Norwegian University of Science and Technology, N-7491 Trondheim (Norway)
Description
The Casimir effect between metal surfaces has now been well-verified at the few per cent level experimentally. However, the temperature dependence has never been observed in the laboratory, since all experiments are conducted at room temperature. The temperature dependence for the related Casimir-Polder force between an atom and a bulk material has, in contrast, been observed between a Bose-Einstein condensate and a silica substrate, with the environment and the silica held at different temperatures. There is a controversy about the temperature dependence for the force between metals, having to do with the magnitude of the linear temperature term for both low and high temperature, the latter being most prominent at large distances. There are also related anomalies pertaining to semiconductors. The status of this controversy, and of the relevant experiments, is reviewed in this report.
Availability note (English)
Available from http://dx.doi.org/10.1088/0031-8949/2012/T151/014070Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Scripta (Online)
- Journal Volume
- 2012
- Journal Issue
- T151
- Journal Page Range
- [7 p.]
- ISSN
- 1402-4896
Conference
- Title
- Conference on frontiers of quantum and mesoscopic thermophysics
- Acronym
- FQMT'11
- Dates
- 25-30 Jul 2011
- Place
- Prague (Czech Republic)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44040522
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMS; BOSE-EINSTEIN CONDENSATION; CASIMIR EFFECT; ELECTRIC CONDUCTORS; METALS; PLATES; SEMICONDUCTOR MATERIALS; SUBSTRATES; SURFACES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- ELEMENTS; MATERIALS; TEMPERATURE RANGE