Published March 12, 2007 | Version v1
Journal article

Electron-temperature control by varying dc voltage to a mesh grid covered by thin film in plasmas

  • 1. Department of Chemical Engineering, National College of Technology, Ichinoseki, Iwate 021-8511 (Japan)
  • 2. Department of Electrical Engineering, Tohoku University, Sendai 980-8579 (Japan)

Description

We discuss theoretically how the resistance of a film deposited on the metal grid affects the efficiency of electron-temperature control by employing a grid-bias method, in which, by using a naked metal grid, the electron temperature decreases from 3.4 to 0.12 eV with a decrease in the grid potential from 40 to - 60 V, being accompanied by an electron-density increase from 0.6 x 109 cm-3 to 6.0 x 109 cm-3 at an argon gas pressure of 5.0 mTorr. The electron temperature can be varied even when the grid is covered with a film with finite resistance, although the range of electron temperature variation is restricted. This method is applicable to reactive plasmas in which grids are often covered by films with finite resistance

Additional details

Identifiers

DOI
10.1016/j.tsf.2006.02.049;
PII
S0040-6090(06)00352-X;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
515
Journal Issue
9
Journal Page Range
p. 4094-4097
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
18. symposium on plasma science for materials
Acronym
SPSM 18
Dates
28-29 Jun 2005
Place
Tokyo (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39022890
Subject category
S36: MATERIALS SCIENCE; S42: ENGINEERING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ARGON; CONTROL; ELECTRON DENSITY; ELECTRON TEMPERATURE; EV RANGE 01-10; GRIDS; MILLI EV RANGE; PLASMA; THIN FILMS
Descriptors DEC
ELECTRODES; ELEMENTS; ENERGY RANGE; EV RANGE; FILMS; FLUIDS; GASES; NONMETALS; RARE GASES

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.