Published August 2005 | Version v1
Journal article Metadata-only

Current Scaling for the Radiative Characteristics of a Micropinch Discharge

Creators

  • 1. Moscow Engineering Physics Institute, Kashirskoe sh. 31, Moscow, 115409 (Russian Federation)

Description

The absolute VUV and soft X-ray (hν > 100 eV) yield from a micropinch discharge is measured for a fixed current of 150 kA. The current scaling in the range of 30-250 kA is found for a number of the discharge parameters: the VUV and soft X-ray yield, the electron temperature, the effective temperature of suprathermal electrons, and the energy of bremsstrahlung emission from thermal electrons. The experimental data are in good agreement with the simulations performed by using the model of radiative collapse in fast Z-pinches in plasmas of high-Z elements

Additional details

Identifiers

DOI
10.1134/1.2031628;

Publishing Information

Journal Title
Plasma Physics Reports
Journal Volume
31
Journal Issue
8
Journal Page Range
p. 677-683
ISSN
1063-780X
CODEN
PPHREM

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37030286
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Translation
Descriptors DEI
BREMSSTRAHLUNG; CURRENTS; ELECTRON TEMPERATURE; ELECTRONS; FAR ULTRAVIOLET RADIATION; ION TEMPERATURE; LINEAR Z PINCH DEVICES; LONGITUDINAL PINCH; PLASMA; PLASMA DIAGNOSTICS; PLASMA SIMULATION; SOFT X RADIATION; X-RAY SOURCES
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; IONIZING RADIATIONS; LEPTONS; LINEAR PINCH DEVICES; OPEN PLASMA DEVICES; PINCH DEVICES; PINCH EFFECT; RADIATION SOURCES; RADIATIONS; SIMULATION; THERMONUCLEAR DEVICES; ULTRAVIOLET RADIATION; X RADIATION

Optional Information

Notes
Translated from Fizika Plazmy, ISSN 0367-2921, 31, 733-741 (No. 8, 2005); (c) 2005 Pleiades Publishing, Inc.