Prompt in-line diagnosis of single bunch transverse profiles and energy spectra for laser-accelerated ions

Many applications of laser-accelerated ions will require beamlines with diagnostic capability for validating simulations and machine performance at the single bunch level as well as for the development of controls to optimize machine performance. We demonstrated prompt, in-line, single bunch transverse profile and energy spectrum detection using a thin luminescent diagnostic and scintillator-based time-of-flight spectrometer simultaneously. The Monte Carlo code, particle and heavy ion transport code systems (PHITS) simulation is shown to be reasonably predictive at low proton energy for the observed transverse profiles measured by the thin luminescent monitor and also for single bunch energy spectra measured by time-of-flight spectrometry. (author)