Comparison of parameter choice methods for the analytical inversion of ARXPS data
Creators
- 1. Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139 (United States)
- 2. INRS Énergie Matériaux Télécommunications, 1650 Lionel-Boulet, Varennes, Québec, Canada J3X 1S2 (Canada)
Description
Highlights: • Nine methods for choosing the regularization parameter were evaluated. • With 0th order regularization and an accurate noise estimate, the Discrepancy Principle did best. • Generalized Maximum Likelihood was the best method not requiring additional information. - Abstract: Using 0th order Tikhonov regularization, we recovered concentration-depth profiles from simulated noisy ARXPS data using nine candidate methods for the selection of the regularization parameter α. Calculations were performed on 1000 noisy data sets at 10 levels of noise ranging from 0.1% to 9%. By comparison with the input profile, the parameter choice methods were rated in terms of the accuracy and reproducibility of the extracted profiles. We discuss the results obtained in the context of the inputs and constraints required by each method
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2014.03.007Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2014.03.007;
- PII
- S0368-2048(14)00076-0;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 193
- Journal Page Range
- p. 63-78
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Austria
- INIS RN
- 46051016
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S97: MATHEMATICAL METHODS AND COMPUTING;
- Descriptors DEI
- CALCULATION METHODS; COMPARATIVE EVALUATIONS; COMPUTER CALCULATIONS; MAXIMUM-LIKELIHOOD FIT; NOISE; SIMULATION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ELECTRON SPECTROSCOPY; EVALUATION; MATHEMATICAL SOLUTIONS; NUMERICAL SOLUTION; PHOTOELECTRON SPECTROSCOPY; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.