Published March 2014 | Version v1
Journal article

Comparison of parameter choice methods for the analytical inversion of ARXPS data

  • 1. Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139 (United States)
  • 2. INRS Énergie Matériaux Télécommunications, 1650 Lionel-Boulet, Varennes, Québec, Canada J3X 1S2 (Canada)

Description

Highlights: • Nine methods for choosing the regularization parameter were evaluated. • With 0th order regularization and an accurate noise estimate, the Discrepancy Principle did best. • Generalized Maximum Likelihood was the best method not requiring additional information. - Abstract: Using 0th order Tikhonov regularization, we recovered concentration-depth profiles from simulated noisy ARXPS data using nine candidate methods for the selection of the regularization parameter α. Calculations were performed on 1000 noisy data sets at 10 levels of noise ranging from 0.1% to 9%. By comparison with the input profile, the parameter choice methods were rated in terms of the accuracy and reproducibility of the extracted profiles. We discuss the results obtained in the context of the inputs and constraints required by each method

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2014.03.007

Additional details

Identifiers

DOI
10.1016/j.elspec.2014.03.007;
PII
S0368-2048(14)00076-0;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
193
Journal Page Range
p. 63-78
ISSN
0368-2048
CODEN
JESRAW

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.