Published May 25, 2006 | Version v1
Journal article

Calculation of lattice strains in oblate inclusions embedded in an isotropic matrix with variable elastic moduli

  • 1. Universitaet des Saarlandes, Postfach 15 11 50, D-66041 Saarbruecken (Germany)

Description

The stress σijI inside spherical and oblate inclusions ('I') is calculated as a function of Young's modulus EM and Poisson's ratio νM of the enclosing infinite isotropic matrix (''M''), which is subjected to an uniaxial tension σ11M. σijI yield the 'transfer X-ray elastic compliances'S1IM and (1/2)S2IM which relate average lattice strains of the inclusions obtained by X-ray diffraction to σijM. The larger (1/2)S2IM the more sensitive is the method of X-ray stress analysis (XSA). On decreasing EM/EI (1/2)S2IM increases and finally reaches a plateau. The effect is stronger if the inclusions become flatter, but decreases with their increasing volume fraction. Flat instead of spherical inclusions might be helpful in XSA of polymers where the lattice strains of added crystalline filler particles are investigated. For flat cubic single-crystals with well-defined crystallographic orientation strong variation of the lattice-plane spacings is observed for special permutations of the Miller indices

Additional details

Identifiers

DOI
10.1016/j.msea.2006.03.016;
PII
S0921-5093(06)00279-6;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
424
Journal Issue
1-2
Journal Page Range
p. 212-222
ISSN
0921-5093
CODEN
MSAPE3

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38079301
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
COMPLIANCE; CRYSTALLOGRAPHY; MATRICES; MILLER INDICES; MONOCRYSTALS; POLYMERS; STRAINS; STRESS ANALYSIS; STRESSES; X-RAY DIFFRACTION; YOUNG MODULUS
Descriptors DEC
COHERENT SCATTERING; CRYSTALS; DIFFRACTION; MECHANICAL PROPERTIES; SCATTERING

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.