Published March 1985
| Version v1
Journal article
Characterization of Nb-8 wt.% A1 wires by analytical electron microscopy
Creators
- 1. Materials Science and Technology Division, Argonne National Laboratory, Argonne, IL
Description
Analytical electron microscopic observations of longitudinal cross-sections of Nb-8 wt.% A1 powder metallurgy processed wire are presented. Grains were found of unreacted Nb, Nb-A1 which was identified as A15 Nb-A1 by convergent beam electron diffraction (CBED), and Nb-A1 grains identified as Nb2A1 by CBED. No unreacted A1 is found. High resolution TEM views for each phase and for regions at the phase boundaries are also presented. Comparisons of the composition of arc melted Nb3A1 are made with the low temperature P/M processed A15 phase
Additional details
Publishing Information
- Journal Title
- IEEE Trans. Magn.
- Journal Volume
- MAG 21
- Journal Issue
- 2
- Series
- IEEE Trans. Magn.
- Journal Page Range
- 815-818
- ISSN
- 0018-9464
- CODEN
- IEMGA
Conference
- Title
- Applied superconductivity conference.
- Dates
- 9-13 Sep 1984.
- Place
- San Diego, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17031150
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM ALLOYS; ELECTRON DIFFRACTION; FABRICATION; NIOBIUM BASE ALLOYS; PHASE STUDIES; POWDER METALLURGY; SUPERCONDUCTING WIRES; SUPERCONDUCTIVITY; TRANSMISSION ELECTRON MICROSCO
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; METALLURGY; MICROSCOPY; NIOBIUM ALLOYS; PHYSICAL PROPERTIES; SCATTERING; WIRES
Optional Information
- Secondary number(s)
- CONF-840937--.