Published June 1, 2013 | Version v1
Journal article

Numerical study of heat transport and fluid flow during the silicon crystal growth process by the Czochralski method

Creators

  • 1. Institute of Refrigeration and Thermal Engineering, School of Mechanical Engineering, Tongji University, Shanghai 200092 (China)

Description

A global analysis of heat transfer and fluid flow in a real Czochralski single silicon crystal furnace is developed using the FLUENT package. Good agreement was obtained for comparisons of the power and crystal growth speed between the simulation and experimental data, and the effect of the length of the crystal on heat transfer and fluid flow was analyzed. The results showed that Tmax increases and its location moves downward as the crystal length increases. The flow pattern in the melt does not change until the crystal grows to 900 mm. As the crystal length increases, the flow pattern in the first gas area only changes when the crystal length is less than 700 mm, but the flow pattern in the second area changes throughout the growth process. (semiconductor materials)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/34/6/063005

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
34
Journal Issue
6
Journal Page Range
[6 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44119813
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CRYSTAL GROWTH; CRYSTALS; CZOCHRALSKI METHOD; FLUID FLOW; GLOBAL ANALYSIS; HEAT TRANSFER; NUMERICAL ANALYSIS; SEMICONDUCTOR MATERIALS; SILICON; SIMULATION
Descriptors DEC
CRYSTAL GROWTH METHODS; ELEMENTS; ENERGY TRANSFER; MATERIALS; MATHEMATICS; SEMIMETALS