Statistical analysis of scatter in critical current of bent superconducting Bi2223 composite tape

The scatter of critical current of bent Bi2223 composite tape was analyzed from a statistical viewpoint. It was revealed that the increase in scatter of the critical current beyond the irreversible bending strain is attributed to the heterogeneous damage evolution. Further modeling analysis, based on the heterogeneous damage evolution, revealed that the distribution of the damage strain parameter-value, which refers to the difference between the intrinsic tensile damage strain and residual strain of the Bi2223 filaments, is described by the two parameter Weibull distribution function, from which the distribution of the normalized critical current value is described by the three parameter Weibull distribution function