Accurate efficiency calibration of a low-energy HPGe detector using a monochromatic x-ray source
- 1. Commissariat a l'Energie Atomique, Laboratoire National Henri Becquerel, 91191 Gif-sur-Yvette Cedex (France)
Description
HPGe detector efficiency has been calibrated using complementary methods involving radioactive x-ray standards, reference synchrotron flux (Super ACO, LURE, France) and a monochromatic x-ray source (SOLEX), combined with Monte Carlo simulation. In the study described here, SOLEX was used to determine the thickness of detector components that create absorption sites in front of the active zone of the detector, by energy scanning in the vicinity of their K and L binding energies. The layers of aluminium (infrared shielding), nickel (electrical contact) and germanium (dead layer) have been measured. This approach ensures accurate determination of the thickness of each component and enables the detector efficiency calculation by Monte Carlo simulation. Differences between simulated data and experimental efficiency values are about 1-5% at energies above 1400 eV and reach 20% at lower energies. (authors)
Availability note (English)
Available from doi:Additional details
Identifiers
- DOI
- 10.1002/xrs.961;
Publishing Information
- Journal Title
- X-Ray Spectrometry, XRS
- Journal Volume
- 36
- Journal Issue
- 3
- Journal Page Range
- p. 191-198
- ISSN
- 0049-8246
Conference
- Title
- 12. European X-ray Spectrometry Conference
- Acronym
- EXRS 2006
- Dates
- 19-23 Jun 2006
- Place
- Paris (France)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- France
- INIS RN
- 40085139
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; ALUMINIUM; BINDING ENERGY; CALIBRATION; COMPUTERIZED SIMULATION; EFFICIENCY; GERMANIUM; HIGH-PURITY GE DETECTORS; KEV RANGE 01-10; LAYERS; MONOCHROMATIC RADIATION; MONTE CARLO METHOD; NICKEL; SYNCHROTRON RADIATION; X RADIATION; X-RAY SOURCES
- Descriptors DEC
- BREMSSTRAHLUNG; CALCULATION METHODS; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY; ENERGY RANGE; GE SEMICONDUCTOR DETECTORS; IONIZING RADIATIONS; KEV RANGE; MEASURING INSTRUMENTS; METALS; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; SEMICONDUCTOR DETECTORS; SIMULATION; SORPTION; TRANSITION ELEMENTS
Optional Information
- Notes
- 11 refs