Published February 14, 2018 | Version v1
Journal article

Dynamics of low temperature excitons in Fe-doped GaN

  • 1. Xi'an Jiaotong University Suzhou Research Institute, Suzhou 215123 (China)
  • 2. Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou 215123 (China)
  • 3. Institute of Semiconductors, Chinese Academy of Sciences, Beijing 10083 (China)

Description

The recombination processes of excitons in Fe-doped GaN have been characterized by time-resolved photoluminescence measurement. The photoluminescence shape at different excitation powers revealed that the hole capture process by Fe2+ centers has always existed in doped GaN. Decreasing of the fast component in the biexponential decay curves with increasing iron concentration indicates the enhancive contribution of the hole capture process. Furthermore, the structures of an iron-related acceptor and complex bound exciton were confirmed by the dependence of lifetime constants on the localization energy. Also, the extended wave function of the hole from the complex bound exciton will enable spin coupling between isolated iron ions. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6463/aaa311

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Physics. D, Applied Physics
Journal Volume
51
Journal Issue
6
Journal Page Range
[5 p.]
ISSN
0022-3727
CODEN
JPAPBE