Published August 1998
| Version v1
Journal article
Design for measurement system of Doppler broadening profiles with the coincidence technique using a NaI detector in colinear geometry with the Ge detector
- 1. Tsukuba Univ., Ibaraki (Japan). Inst. of Materials Science
Description
The measurement system for Doppler broadening profiles with the coincidence technique using a NaI detector in colinear geometry with a Ge detector was developed. The principle of measurement system with the coincidence technique between the NaI detector and the Ge detector was described. Application of the system for the detection of vacancy-type defects introduced by electron irradiation in Czochralski-(Cz) grown Si was shown. Detail in the difference between the Doppler broadening profiles for Cz-Si and Si grown by the floating-zone method was also obtained. (author)
Additional details
Publishing Information
- Journal Title
- Radioisotopes (Tokyo)
- Journal Volume
- 47
- Journal Issue
- 8
- Journal Page Range
- p. 623-627
- ISSN
- 0033-8303
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 29059446
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BETA-PLUS DECAY; DIAGNOSTIC TECHNIQUES; DOPPLER BROADENING; GAMMA DETECTION; GE SEMICONDUCTOR DETECTORS; NAI DETECTORS; POSITRON SOURCES; SODIUM 22
- Descriptors DEC
- BETA DECAY; BETA DECAY RADIOISOTOPES; BETA-PLUS DECAY RADIOISOTOPES; DECAY; DETECTION; ISOMERIC TRANSITION ISOTOPES; ISOTOPES; LIGHT NUCLEI; LINE BROADENING; MEASURING INSTRUMENTS; NANOSEC LIVING RADIOISOTOPES; NUCLEAR DECAY; NUCLEI; ODD-ODD NUCLEI; PARTICLE SOURCES; RADIATION DETECTION; RADIATION DETECTORS; RADIATION SOURCES; RADIOISOTOPES; SCINTILLATION COUNTERS; SEMICONDUCTOR DETECTORS; SODIUM ISOTOPES; SOLID SCINTILLATION DETECTORS; YEARS LIVING RADIOISOTOPES