Published April 15, 2007
| Version v1
Journal article
Space charge-limited conduction in Ag/p-Si Schottky diode
- 1. Department of Physics, Faculty of Arts and Sciences, Firat University, 23119 Elazig (Turkey)
- 2. Department of Materials Research, Ankara Nuclear Research and Training Center, Besevler, 06100 Ankara (Turkey)
Description
The space charge-limited conduction mechanism in Ag/p-Si Schottky diode was investigated at range of 175-275K temperatures and detail information about low-temperature conduction mechanism of the Schottky diode could be obtained. Current-voltage characteristics and the power-law dependence was found to be governed by space charge-limited currents. In this conduction mechanism, the current increases superlinearly in the diode , i.e, I∝Vm. The I-V curves in the reverse direction at different temperatures are taken and interpreted via both Schottky and Poole-Frenkel effects. Poole-Frenkel effect was found to be dominant in the reverse direction. The density of localized states was determined, as well through the SCLC theory
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2006.11.018;
- PII
- S0921-4526(06)01834-5;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 392
- Journal Issue
- 1-2
- Journal Page Range
- p. 188-191
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38084971
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ENERGY-LEVEL DENSITY; FRENKEL DEFECTS; P-TYPE CONDUCTORS; SCHOTTKY BARRIER DIODES; SILICON; SILVER; SPACE CHARGE; TEMPERATURE DEPENDENCE
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CURRENTS; ELECTRICAL PROPERTIES; ELEMENTS; MATERIALS; METALS; PHYSICAL PROPERTIES; POINT DEFECTS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMICONDUCTOR MATERIALS; SEMIMETALS; TRANSITION ELEMENTS; VACANCIES
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.