Published November 2006 | Version v1
Journal article

Electronic structure of the Au-Si(1 1 1) interface as a function of Au coverage

  • 1. Graduate School of Science, Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Kouto, Kamigori, Ako 678-1205 (Japan)

Description

We have investigated the Au-Si(1 1 1) interface as a function of the Au coverage by the core-level photoemission spectroscopy. With increasing the Au coverage, the spectral features in the Si 2p core-level changed remarkably and some fine structures in both Si 2p and Au 4f spectra were observed. Based on the curve fitting analysis, the Si 2p and Au 4f spectra at more than 20 A Au coverage were decomposed into three chemically different components, respectively. The assignments of their components were performed. In addition, we have compared these results for the Au-Si(1 1 1) interface with our previous study for the Au-Si(1 0 0) interface. It was found that the electronic structures for the Au-Si(1 1 1) interface is essentially identical to those of the Au-Si(1 0 0) interface except at the initial Au deposition

Additional details

Identifiers

DOI
10.1016/j.radphyschem.2005.09.019;
PII
S0969-806X(06)00289-1;

Publishing Information

Journal Title
Radiation Physics and Chemistry (1993)
Journal Volume
75
Journal Issue
11
Journal Page Range
p. 1943-1947
ISSN
0969-806X
CODEN
RPCHDM

Conference

Title
20. international conference on X-ray and inner-shell processes
Dates
4-8 Jul 2005
Place
Melbourne (Australia)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38040132
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DEPOSITION; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; FINE STRUCTURE; GOLD ALLOYS; INTERFACES; PHOTOEMISSION; SILICON ALLOYS; SYNCHROTRON RADIATION
Descriptors DEC
ALLOYS; BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; EMISSION; RADIATIONS; SECONDARY EMISSION; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.