Electronic structure of the Au-Si(1 1 1) interface as a function of Au coverage
- 1. Graduate School of Science, Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Kouto, Kamigori, Ako 678-1205 (Japan)
Description
We have investigated the Au-Si(1 1 1) interface as a function of the Au coverage by the core-level photoemission spectroscopy. With increasing the Au coverage, the spectral features in the Si 2p core-level changed remarkably and some fine structures in both Si 2p and Au 4f spectra were observed. Based on the curve fitting analysis, the Si 2p and Au 4f spectra at more than 20 A Au coverage were decomposed into three chemically different components, respectively. The assignments of their components were performed. In addition, we have compared these results for the Au-Si(1 1 1) interface with our previous study for the Au-Si(1 0 0) interface. It was found that the electronic structures for the Au-Si(1 1 1) interface is essentially identical to those of the Au-Si(1 0 0) interface except at the initial Au deposition
Additional details
Identifiers
- DOI
- 10.1016/j.radphyschem.2005.09.019;
- PII
- S0969-806X(06)00289-1;
Publishing Information
- Journal Title
- Radiation Physics and Chemistry (1993)
- Journal Volume
- 75
- Journal Issue
- 11
- Journal Page Range
- p. 1943-1947
- ISSN
- 0969-806X
- CODEN
- RPCHDM
Conference
- Title
- 20. international conference on X-ray and inner-shell processes
- Dates
- 4-8 Jul 2005
- Place
- Melbourne (Australia)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38040132
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DEPOSITION; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; FINE STRUCTURE; GOLD ALLOYS; INTERFACES; PHOTOEMISSION; SILICON ALLOYS; SYNCHROTRON RADIATION
- Descriptors DEC
- ALLOYS; BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; EMISSION; RADIATIONS; SECONDARY EMISSION; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.