An improved decomposition scheme for assessing the reliability of embedded systems by using dynamic fault trees
Creators
- 1. Department of Computer Science, National Tsing Hua University, Hsinchu, Taiwan (China)
- 2. Institute of Nuclear Energy Research, Atomic Energy Council, Taoyuan, Taiwan (China)
Description
The theories of fault trees have been used for many years because they can easily provide a concise representation of failure behavior of general non-repairable fault tolerant systems. But the defect of traditional fault trees is lack of accuracy when modeling dynamic failure behavior of certain systems with fault-recovery process. A solution to this problem is called behavioral decomposition. A system will be divided into several dynamic or static modules, and each module can be further analyzed using binary decision diagram (BDD) or Markov chains separately. In this paper, we will show a very useful decomposition scheme that independent subtrees of a dynamic module are detected and solved hierarchically. Experimental results show that the proposed method could result in significant saving of computation time without losing unacceptable accuracy. Besides, we also present an analyzing software toolkit: DyFA (dynamic fault-trees analyzer) which implements the proposed methodology
Additional details
Identifiers
- DOI
- 10.1016/j.ress.2006.09.008;
- PII
- S0951-8320(06)00201-8;
Publishing Information
- Journal Title
- Reliability Engineering and System Safety
- Journal Volume
- 92
- Journal Issue
- 10
- Journal Page Range
- p. 1403-1412
- ISSN
- 0951-8320
- CODEN
- RESSEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38089610
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- ACCURACY; CALCULATION METHODS; COMPUTER CODES; DECOMPOSITION; DIAGRAMS; FAILURES; FAULT TREE ANALYSIS; MARKOV PROCESS; MATHEMATICAL SOLUTIONS; RELIABILITY; SENSITIVITY ANALYSIS; SIMULATION
- Descriptors DEC
- CHEMICAL REACTIONS; INFORMATION; STOCHASTIC PROCESSES; SYSTEM FAILURE ANALYSIS; SYSTEMS ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.