Published October 2007 | Version v1
Journal article

An improved decomposition scheme for assessing the reliability of embedded systems by using dynamic fault trees

  • 1. Department of Computer Science, National Tsing Hua University, Hsinchu, Taiwan (China)
  • 2. Institute of Nuclear Energy Research, Atomic Energy Council, Taoyuan, Taiwan (China)

Description

The theories of fault trees have been used for many years because they can easily provide a concise representation of failure behavior of general non-repairable fault tolerant systems. But the defect of traditional fault trees is lack of accuracy when modeling dynamic failure behavior of certain systems with fault-recovery process. A solution to this problem is called behavioral decomposition. A system will be divided into several dynamic or static modules, and each module can be further analyzed using binary decision diagram (BDD) or Markov chains separately. In this paper, we will show a very useful decomposition scheme that independent subtrees of a dynamic module are detected and solved hierarchically. Experimental results show that the proposed method could result in significant saving of computation time without losing unacceptable accuracy. Besides, we also present an analyzing software toolkit: DyFA (dynamic fault-trees analyzer) which implements the proposed methodology

Additional details

Identifiers

DOI
10.1016/j.ress.2006.09.008;
PII
S0951-8320(06)00201-8;

Publishing Information

Journal Title
Reliability Engineering and System Safety
Journal Volume
92
Journal Issue
10
Journal Page Range
p. 1403-1412
ISSN
0951-8320
CODEN
RESSEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38089610
Subject category
S42: ENGINEERING;
Descriptors DEI
ACCURACY; CALCULATION METHODS; COMPUTER CODES; DECOMPOSITION; DIAGRAMS; FAILURES; FAULT TREE ANALYSIS; MARKOV PROCESS; MATHEMATICAL SOLUTIONS; RELIABILITY; SENSITIVITY ANALYSIS; SIMULATION
Descriptors DEC
CHEMICAL REACTIONS; INFORMATION; STOCHASTIC PROCESSES; SYSTEM FAILURE ANALYSIS; SYSTEMS ANALYSIS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.