Intercalibration of small-angle X-ray and neutron scattering data
- 1. IBM Research Div., San Jose, CA (USA). Almaden Research Center
- 2. Oak Ridge National Lab., TN (USA). National Center for Small-Angle Scattering Research
Description
Absolute calibration forms a valuable diagnostic tool in small-angle scattering experiments and allows the parameters of a given model to be restricted to the set which reproduces the observed intensity. General methods which are available for absolute scaling of small-angle X-ray scattering (SAXS) data are reviewed along with estimates of the degree of internal consistency which may be achieved between the various standards. In order to minimize the time devoted to calibration in a given experimental program, emphasis is placed on developing a set of precalibrated strongly scattering standards for the SAXS facilities of the National Center for Small-Angle Scattering Research (Oak Ridge). Similar standards have been developed previously for calibration of small-angle neutron scattering (SANS) data. Particular attention is given to standards which can be used for either SAXS or SANS experiments where each sample has been independently calibrated for both types of radiation. These calibrations have been tested via the theoretical relationships between the two cross sections. It has been found that specimens best suited for such intercalibration purposes are a glassy carbon specimen where the scattering arises from voids in a carbon matrix and a perdeuterated polyethylene where the scattering arises from periodic arrangement of the crystalline lamellae. In only these two cases could the identical specimen be used for both the neutron and X-ray scattering experiments. (orig.)
Additional details
Publishing Information
- Journal Title
- Journal of Applied Crystallography
- Journal Volume
- 21
- Journal Issue
- 6
- Series
- J. Appl. Crystallogr.
- Journal Page Range
- 629-638
- ISSN
- 0021-8898
- CODEN
- JACGA
Conference
- Title
- International conference on applications and techniques of small-angle scattering.
- Dates
- 26-29 Oct 1987.
- Place
- Argonne, IL (USA).
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 20035562
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM; AMORPHOUS STATE; CALIBRATION; CARBON; CROSS SECTIONS; NEUTRON DIFFRACTION; PARTICLES; PHYSICAL RADIATION EFFECTS; POLYETHYLENES; SCALING; SILICON OXIDES; SMALL ANGLE SCATTERING; STANDARDIZATION; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; COHERENT SCATTERING; CORROSION; DIFFRACTION; ELEMENTS; METALS; NONMETALS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXIDES; OXYGEN COMPOUNDS; POLYMERS; POLYOLEFINS; RADIATION EFFECTS; SCATTERING; SILICON COMPOUNDS