A reflective image-rotating periscope for spatially resolved Thomson-scattering experiments on OMEGA
Creators
- 1. Laboratory for Laser Energetics, University of Rochester, 250 East River Road, Rochester, NY 14623-1299 (United States)
- 2. Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, CA 94550 (United States)
Description
A reflective image rotating periscope has been deployed on the Thomson-scattering system at the Laboratory for Laser Energetics, enabling the capability to make spatially resolved measurements of plasma conditions using either the 2ω (527-nm) or 4ω (263-nm) probe beam. The spectral content of ion-acoustic and electron plasma wave Thomson-scattering features are analyzed along the probe beam's axis of propagation using a pair of imaging Czerny-Turner spectrometers. A method for calculating image rotation was applied to design a translating periscope mirror assembly that provides fine adjustment of the image orientation at the spectrometer input plane. Spectrally dispersed Thomson-scattering signals are recorded using time-gated intensified charge-coupled–device cameras. Spectral resolution of up to 0.03 nm (0.2 nm) is achieved using a 1-m (0.3-m) spectrometer, allowing for simultaneous measurements of the ion-acoustic and electron plasma wave features. The optical system's 20-μm imaging resolution provides excellent noise rejection and spatial definition of the Thomson-scattering volume
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/8/12/C12009Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 8
- Journal Issue
- 12
- Journal Page Range
- p. C12009
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46042082
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAMS; CHARGE-COUPLED DEVICES; ELECTRON PLASMA WAVES; IMAGES; PERISCOPES; PROBES; RESOLUTION; SIGNALS; SPECTROMETERS; THOMSON SCATTERING
- Descriptors DEC
- INELASTIC SCATTERING; MEASURING INSTRUMENTS; OPTICAL SYSTEMS; PLASMA WAVES; SCATTERING; SEMICONDUCTOR DEVICES