Surface modification of silica-coated zirconia by chemical treatments
- 1. Dental Materials Science, Faculty of Dentistry, University of Hong Kong (Hong Kong)
- 2. Department of Physics and Astronomy, Faculty of Mathematics and Natural Sciences, University of Turku (Finland)
Description
Zirconia surface modification by various chemical treatments after silica coating by sandblasting was investigated in this study. The surface of silica-coated dental zirconia was hydroxylated by treatment with different acids at room temperature for 4 h, rinsed with deionized water and air-dried. The modified surfaces were characterized by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). Shifts in binding energies for Zr 3d5/2 and Si 2p peaks were observed after treatment with acids, thereby showing a change in the chemical states of zirconium and silicon on the surface layer of silica-coated zirconia. The XPS analysis revealed that the silica-coated zirconia (SiO2-ZrO2) surfaces had changed to hydrous silica-coated zirconia (SiO2-ZrO2.nH2O). One-way ANOVA analysis revealed there was significant difference in both surface roughness parameters of silica-coated zirconia after chemical treatments and the surface topography varied depending on the acid treatment.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2010.08.029Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2010.08.029;
- PII
- S0169-4332(10)01093-7;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 257
- Journal Issue
- 4
- Journal Page Range
- p. 1228-1235
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44024288
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; BINDING ENERGY; CHEMICAL STATE; HYDROXYLATION; LAYERS; MODIFICATIONS; ROUGHNESS; SILICA; SURFACE TREATMENTS; SURFACES; TEMPERATURE RANGE 0273-0400 K; X-RAY PHOTOELECTRON SPECTROSCOPY; ZIRCONIUM; ZIRCONIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; ELECTRON SPECTROSCOPY; ELEMENTS; ENERGY; METALS; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SPECTROSCOPY; SURFACE PROPERTIES; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; ZIRCONIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.