Published 2001
| Version v1
Miscellaneous
Quantitative XRF analysis of multielemental mono- and polycrystals. Determination of Cr, Mn, Ni, Cu, Zn, Ga, As, Se, Sb, Yb in thin powder samples
Creators
- 1. Zaklad Chemii Analitycznej, Uniwersytet Slaski, Katowice (Poland)
Description
no abstract available
Additional details
Additional titles
- Original title (Polish)
- Ilosciowa analiza XRF wielopierwiastkowych mono- i polikrysztalow. Oznaczanie Cr, Mn, Ni, Cu, Zn, Ga, As, Se, Sb, Yb w cienkich probkach proszkowych
Publishing Information
- ISBN
- 83-90-1844-5-1
- Imprint Title
- Materials of 44. Scientific Assembly of Polish Chemical Society and Association of Engineers and Technicians of Chemical Industry
- Imprint Pagination
- [WP 1-10; S1 R1- R3; S1 K1-K4; S1 P1-P18; S2 R1-R2; S2 K1-K17; S2 P1-P31; S3 R1-R3; S3 K1-K9; S3 P1-P22; S4 R1-R3; S4 K1-K7; S4 P1-P37; S5 R1-R2; S5 K1; S5 P1-P3; S6 R1-R6; S6 K1-K12; S6 P1-P96; S7 R1-R6; S7 K1-K8; S7 P1-P45; S8 R1-R16; S8 K1-K5; S8 P1-P57; S9 R1-R9; S9 K1-K7; S9 K1-K7; S9 P1-P56; S10 R1-R2; S11 R1-R3; S11 K1-K8; S11 P1-P44; S12 R1-R4; S12 K1-K8; S12 P1-p43; S13 R1-R7; S13 K1-K6; S13 P1-P62; S14 R1-R2; S14 K1-K17; S15 R1-R4; S15 K1-K5; S15 P1-P47; M1 R1-R2; M1 K1-K4; M1 P1-P14; SSG1-SSG31]
- Journal Page Range
- p. S15-P14
Conference
- Title
- 44. Scientific Assembly of Polish Chemical Society and Association of Engineers and Technicians of Chemical Industry
- Original Conference Title
- 44. Zjazd Naukowy Polskiego Towarzystwa Chemicznego i Stowarzyszenia Inzynierow i Technikow Przemyslu Chemicznego
- Dates
- 9-13 Sep 2001
- Place
- Katowice (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 33066068
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- ANTIMONY; ARSENIC; CALIBRATION; CHEMICAL COMPOSITION; CHROMIUM; COPPER; GALLIUM; MANGANESE; MONOCRYSTALS; MULTI-ELEMENT ANALYSIS; NICKEL; POLYCRYSTALS; POWDERS; SAMPLE PREPARATION; SELENIUM; X-RAY FLUORESCENCE ANALYSIS; YTTERBIUM; ZINC
- Descriptors DEC
- CHEMICAL ANALYSIS; CRYSTALS; ELEMENTS; METALS; NONDESTRUCTIVE ANALYSIS; RARE EARTHS; SEMIMETALS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 1 ref Imprint:Materialy Zjazdowe 44. Zjazdu Naukowego Polskiego Towarzystwa Chemicznego i Stowarzyszenia Inzynierow i Technikow Przemyslu Chemicznego