Published July 1, 2018 | Version v1
Journal article

The effect of parameters space on the accuracy of curvature-based potential between curved surface body and an outside particle

  • 1. State key laboratory of mechanics and control of mechanical structures, College of Aerospace Engineering, Nanjing University of Aeronautics and Astronautics, 211100, Nanjing (China)
  • 2. School of Mechanical and Power Engineering, Nanjing Tech University, No.30 Puzhu Road, Nanjing, China, 211816 (China)

Description

Previously, based on the negative exponential pair potential (1/R)n, the interaction potential of curved surface body and an outside particle is expressed as the function of local curvatures. In the process of derivation, several assumptions are taken, including physical model approximation and mathematical approach. In this paper, the effect of parameters space on the accuracy of curvature-based potential in the physical model approximation will be discussed. By numerically calculating the interaction potential, the accuracy is tested by comparing the numerical potential among different curved surface bodies with the same local shape and different parameters. At last, the conclusion is proposed that the curvature-based potential widely exists in the highly curved space at micro/nano scales due to short-range interaction and highly curved material space. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/1053/1/012080

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
1053
Journal Issue
1
Journal Page Range
[7 p.]
ISSN
1742-6596

Conference

Title
1. International Conference on Physics, Mathematics and Statistics
Acronym
ICPMS2018
Dates
12-14 May 2018
Place
Shanghai (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
53011189
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; COMPARATIVE EVALUATIONS; INTERACTION RANGE; SURFACES
Descriptors DEC
DISTANCE; EVALUATION