The effect of parameters space on the accuracy of curvature-based potential between curved surface body and an outside particle
Creators
- 1. State key laboratory of mechanics and control of mechanical structures, College of Aerospace Engineering, Nanjing University of Aeronautics and Astronautics, 211100, Nanjing (China)
- 2. School of Mechanical and Power Engineering, Nanjing Tech University, No.30 Puzhu Road, Nanjing, China, 211816 (China)
Description
Previously, based on the negative exponential pair potential (1/R)n, the interaction potential of curved surface body and an outside particle is expressed as the function of local curvatures. In the process of derivation, several assumptions are taken, including physical model approximation and mathematical approach. In this paper, the effect of parameters space on the accuracy of curvature-based potential in the physical model approximation will be discussed. By numerically calculating the interaction potential, the accuracy is tested by comparing the numerical potential among different curved surface bodies with the same local shape and different parameters. At last, the conclusion is proposed that the curvature-based potential widely exists in the highly curved space at micro/nano scales due to short-range interaction and highly curved material space. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1053/1/012080Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1053
- Journal Issue
- 1
- Journal Page Range
- [7 p.]
- ISSN
- 1742-6596
Conference
- Title
- 1. International Conference on Physics, Mathematics and Statistics
- Acronym
- ICPMS2018
- Dates
- 12-14 May 2018
- Place
- Shanghai (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53011189
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; COMPARATIVE EVALUATIONS; INTERACTION RANGE; SURFACES
- Descriptors DEC
- DISTANCE; EVALUATION