Published November 15, 2013
| Version v1
Journal article
Effects of the atomic level shift in the Auger neutralization rates of noble metal surfaces
- 1. Departamento de Física Teórica de la Materia Condensada and Condensed Matter Physics Centre (IFIMAC), Universidad Autónoma de Madrid, 28049 Madrid (Spain)
- 2. Institut für Experimentalphysik, Abteilung für Atom-und Oberflächenphysik, Johannes Kepler Universität Linz, 4040 Linz (Austria)
Description
In this work we compare characteristics of Auger neutralization of He+ ions at noble metal and free-electron metal surfaces. For noble metals, we find that the position of the energy level of He with respect to the Fermi level has a non-negligible influence on the values of the calculated Auger rates through the evaluation of the surface dielectric susceptibility. We conclude that even though our calculated rates are accurate, further theoretical effort is needed to obtain realistic values of the energy level of He in front of these surfaces
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2013.03.031Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2013.03.031;
- PII
- S0168-583X(13)00365-0;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 315
- Journal Page Range
- p. 206-212
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 25. international conference on atomic collisions in solids
- Acronym
- ICACS-25
- Dates
- 21-25 Oct 2012
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45067562
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE EXCHANGE; COMPARATIVE EVALUATIONS; DIELECTRIC MATERIALS; FERMI LEVEL; HELIUM IONS; METALS; SURFACES
- Descriptors DEC
- CHARGED PARTICLES; ELEMENTS; ENERGY LEVELS; EVALUATION; IONS; MATERIALS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.