Published March 6, 2007 | Version v1
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Next-Generation Active-Pixel Sensor Devices With CMOS-avalanche photodiodes

Description

Modern high-energy physics experiments that explore the fundamental properties of matter rely on large, sophisticated instruments for tracking particle decay events with large detector arrays. The performance of these instruments is limited by the available detector technology. Future progress depends on breakthroughs in the sensitivity, speed and signal-to-noise performance of the detectors. Phase I research successfully developed and tested many different pixel designs. Several different pixel and circuit applications were designed based on previously manufactured chips, but with the vertex detector application in mind. We have characterized the noise performance and sensitivity of CMOS APD pixels using several different types of radiation and selected the best designs. Phase II will were are concerned with transforming our test structures into fully functional detector elements with the appropriate processing and readout electronics integrated with large arrays of pixels. We investigated methods to increase the active area and reduce the noise while implementing an event-driven readout scheme to drastically increase the readout speed and simplify the data stream

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Additional details

Publishing Information

Imprint Pagination
19 p.
Report number
DOE/ER--84162

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
38116817
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
MONITORING; PARTICLE DECAY; PERFORMANCE; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SENSITIVITY; VELOCITY
Descriptors DEC
DECAY; DETECTION; MEASURING INSTRUMENTS

Optional Information

Contract/Grant/Project number
C06-17; FG02-05ER84162
Funding organization
US Department of Energy (United States)