Next-Generation Active-Pixel Sensor Devices With CMOS-avalanche photodiodes
Description
Modern high-energy physics experiments that explore the fundamental properties of matter rely on large, sophisticated instruments for tracking particle decay events with large detector arrays. The performance of these instruments is limited by the available detector technology. Future progress depends on breakthroughs in the sensitivity, speed and signal-to-noise performance of the detectors. Phase I research successfully developed and tested many different pixel designs. Several different pixel and circuit applications were designed based on previously manufactured chips, but with the vertex detector application in mind. We have characterized the noise performance and sensitivity of CMOS APD pixels using several different types of radiation and selected the best designs. Phase II will were are concerned with transforming our test structures into fully functional detector elements with the appropriate processing and readout electronics integrated with large arrays of pixels. We investigated methods to increase the active area and reduce the noise while implementing an event-driven readout scheme to drastically increase the readout speed and simplify the data stream
Files
System files
(41.7 kB)
| Name | Size | Download all |
|---|
Additional details
Publishing Information
- Imprint Pagination
- 19 p.
- Report number
- DOE/ER--84162
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 38116817
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- MONITORING; PARTICLE DECAY; PERFORMANCE; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SENSITIVITY; VELOCITY
- Descriptors DEC
- DECAY; DETECTION; MEASURING INSTRUMENTS
Optional Information
- Contract/Grant/Project number
- C06-17; FG02-05ER84162
- Funding organization
- US Department of Energy (United States)