Published 1975 | Version v1
Book

Depth distribution of damage due to ionization

  • 1. Atomic Energy of Canada Ltd., Chalk River, Ontario

Description

The depth distribution of the damage due to ionization caused by heavy ion irradiation is calculated by the transport equation method previously used for the calculation of range and damage distributions. The calculation differs from Brice's chiefly in that it allows for the transport of energy by recoils away from the primary projectile path. Like the damage distribution, it should be more accurate than Brice's at low energies. It is found that a power-law limit of the ionization distribution can be constructed; thus one may take advantage of the simple scaling properties of power-law distributions. The importance of energy transport by recoils is examined for both ionization and damage distributions. A qualitative distinction between the ionization distribution and range or damage distributions is that the ionization distribution is discontinuous at the target surface. (This refers to the infinite target of the calculations, where the ''surface'' is merely a plane at which ion motion starts.) The differential-equation method of obtaining distributions from moments is generalized to allow inclusion of this discontinuity. (U.S.)

Additional details

Additional titles

Augmented title (English)
"5"6Fe, "2"8Si, "1"4N ions incident on "2"8Si

Publishing Information

Publisher
Plenum Publishing Corp.
Imprint Place
New York
Imprint Title
Atomic collisions in solids. Vol. 1
Imprint Pagination
p. 35-46.

Conference

Title
3. international conference on atomic collisions in solids.
Dates
23 Sep 1973.
Place
Gatlinburg, Tennessee, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
6208373
Subject category
S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGED-PARTICLE TRANSPORT; COLLISIONS; ENERGY LOSSES; HEAVY IONS; IONIZATION; IRON IONS; KEV RANGE 01-10; KEV RANGE 10-100; NITROGEN IONS; PHYSICAL RADIATION EFFECTS; SILICON; SILICON IONS
Descriptors DEC
CHARGED PARTICLES; ELEMENTS; ENERGY RANGE; IONS; KEV RANGE; RADIATION EFFECTS; RADIATION TRANSPORT; SEMIMETALS

Optional Information

Notes
Imprint:See CONF-730958--P1.