Published December 4, 2013 | Version v1
Journal article

Asymmetric current-phase relation due to spin-orbit interaction in semiconductor nanowire Josephson junction

  • 1. Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522 (Japan)
  • 2. Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands (Netherlands)

Description

We theoretically study the current-phase relation in semiconductor nanowire Josephson junction in the presence of spin-orbit interaction. In the nanowire, the impurity scattering with strong SO interaction is taken into account using the random matrix theory. In the absence of magnetic field, the Josephson current I and phase difference φ between the superconductors satisfy the relation of I(φ) = –I(–φ). In the presence of magnetic field along the nanowire, the interplay between the SO interaction and Zeeman effect breaks the current-phase relation of I(φ) = –I(–φ). In this case, we show that the critical current depends on the current direction, which qualitatively agrees with recent experimental findings

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1566
Journal Issue
1
Journal Page Range
p. 423-424
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
31. international conference on the physics of semiconductors
Acronym
ICPS 2012
Dates
29 Jul - 3 Aug 2012
Place
Zurich (Switzerland)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45083098
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRITICAL CURRENT; IMPURITIES; INTERACTIONS; JOSEPHSON JUNCTIONS; L-S COUPLING; MAGNETIC FIELDS; SCATTERING; SEMICONDUCTOR MATERIALS; SUPERCONDUCTORS; ZEEMAN EFFECT
Descriptors DEC
COUPLING; CURRENTS; ELECTRIC CURRENTS; INTERMEDIATE COUPLING; MATERIALS; SUPERCONDUCTING JUNCTIONS

Optional Information

Notes
(c) 2013 AIP Publishing LLC