Published October 2011 | Version v1
Journal article

Three-dimensional (3D) microstructural characterization and quantification of reflow porosity in Sn-rich alloy/copper joints by X-ray tomography

  • 1. Materials Science and Engineering Arizona State University Tempe, AZ 85287-6106 (United States)
  • 2. Intel Corporation 5000 W. Chandler Blvd., Chandler, AZ 85226 (United States)

Description

In this paper high resolution X-ray tomography was used to characterize reflow porosity in Sn-3.9Ag-0.7Cu/Cu solder joints. The combination of two segmentation techniques was applied for the three-dimensional (3D) visualization of pores in the joints and the quantification on the characteristics of reflow porosity, including pore size, volume fraction and morphology. The size, morphology and distribution of porosity were visualized in 3D for three different solder joints. Since the results are relatively similar for all three, only the results of one joint are presented. Solder reflow porosity was mostly spherical, segregated along the solder/Cu interface, and had an average pore size of 30 μm in diameter. A few large pores (larger than 100 μm in diameter) were present, some of which had lower sphericity, i.e., they were more irregular. The presence of these large pores may significantly influence the mechanical behavior of solder joints. - Highlights: → Non-destructive 3D characterization and quantification of porosity in Pb-free solders by X-ray tomography → Two new image analysis and reconstruction tools are presented that can be used by the community at large → Pore size, volume fraction, and sphericity, is critical to understanding microstructure and modeling of these systems

Availability note (English)

Available from http://dx.doi.org/10.1016/j.matchar.2011.07.011

Additional details

Identifiers

DOI
10.1016/j.matchar.2011.07.011;
PII
S1044-5803(11)00174-4;

Publishing Information

Journal Title
Materials Characterization
Journal Volume
62
Journal Issue
10
Journal Page Range
p. 970-975
ISSN
1044-5803
CODEN
MACHEX

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.