Published April 1985 | Version v1
Journal article

Rotary probe traversing mechanism

  • 1. The Hokenson Company, Los Angeles, California 90005

Description

A simple mechanical device is presented which allows a probe to scan a plane in space without translating the probe support. The mechanism relies on the rotation of two shafts, one of which rotates the probe through space and the other controls the probe offset from the axis of rotation. The characteristic width of the area swept out is four times the characteristic width of the device. A simple ratcheting gear allows adjacent planes to be scanned for the purpose of obtaining gradients. Computerized control of the shafts rotations also allows noncircular domains to be scanned

Additional details

Publishing Information

Journal Title
Rev. Sci. Instrum.
Journal Volume
56
Journal Issue
4
Series
Rev. Sci. Instrum.
Journal Page Range
628-629
ISSN
0034-6748

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
16068849
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ON-LINE CONTROL SYSTEMS; PROBES; ROTATION
Descriptors DEC
CONTROL SYSTEMS; ON-LINE SYSTEMS