Published June 2014 | Version v1
Journal article

MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography

  • 1. Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin, BP48, 91192, Gif-sur-Yvette (France)
  • 2. Centre de Sciences Nucléaires et Sciences de la Matière, Université Paris Sud and CNRS/IN2P3, Bât. 104 et 108, 91405, Orsay Campus (France)

Description

Hard X-ray micro-tomography is a powerful tool to reveal the internal structure of thick objects in a non-destructive manner. For synchrotron applications and practical lab works with students, a 2D detector based on a thin YAG:Ce scintillator optically coupled to a new generation high frame rate (100 fps) low noise sCMOS camera has been developed and characterized in depth on the METROLOGIE and PSICH'E beamlines of the SOLEIL synchrotron. The Detector gain, Modulation Transfer Function, Noise Power Spectrum and Detective Quantum Efficiency have been measured and compared with analytical model. A tomography reconstruction was performed on small insects to demonstrate the performance of this X-ray imaging detector

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/9/06/C06001

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
9
Journal Issue
06
Journal Page Range
p. C06001
ISSN
1748-0221