Published October 1975 | Version v1
Journal article Metadata-only

Pre-irradiation indicator for total-dose ionizing radiation-sensitivity

Creators

  • 1. Naval Research Lab., Washington, DC

Description

A technique providing the means to predict the ionizing radiation-sensitivity of devices possessing insulator-semiconductor structures without requiring irradiation is described. This technique is highly amenable to commercial on-line procedures for controlling processes and hardness-assurance lot-sampling, as well as for process-related hardening investigations. (WHK)

Additional details

Identifiers

DOI
10.1109/tns.1975.4328074;

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
22
Journal Issue
5
Series
IEEE (Inst. Electr. Electron. Eng.) Trans. Nucl. Sci.
Journal Page Range
2118-2119
ISSN
0018-9499

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
7229415
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
PERFORMANCE TESTING; PHYSICAL RADIATION EFFECTS; QUALITY CONTROL; RADIOSENSITIVITY; SEMICONDUCTOR DEVICES
Descriptors DEC
CONTROL; RADIATION EFFECTS; TESTING

Optional Information

Notes
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