Published August 2014 | Version v1
Journal article

Ion flux dependence of atomic hydrogen loss probabilities on tungsten and carbon surfaces

Description

Concerns over fuel inventory and consequently radiation safety in a fusion device necessitates a better understanding of complex plasma–material interactions. Pulsed induced fluorescence is employed to determine the loss probability of atomic hydrogen on graphite and tungsten in a low-pressure radio-frequency discharge with an applied magnetic field. The interaction between the plasma and sample material surface leads to a two-stage decay in the atomic hydrogen loss rate in the plasma afterglow, from which the loss probability is determined. The loss rates are found to be dependent on the ion flux. An increase in the ion flux from 1.6 × 1020 m−2 s−1 to 5.5 × 1021 m−2 s−1 leads to an increase in the loss probability by a factor of two for both graphite and tungsten in the near afterglow. The results demonstrate that the plasma operating conditions play an important role in the loss probability of atomic hydrogen at surfaces of fusion-relevant materials

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jnucmat.2014.03.053

Additional details

Identifiers

DOI
10.1016/j.jnucmat.2014.03.053;
PII
S0022-3115(14)00180-9;

Publishing Information

Journal Title
Journal of Nuclear Materials
Journal Volume
451
Journal Issue
1-3
Journal Page Range
p. 211-215
ISSN
0022-3115
CODEN
JNUMAM

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46045949
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Descriptors DEI
FLUORESCENCE; GRAPHITE; HYDROGEN; INTERACTIONS; IONS; MAGNETIC FIELDS; PLASMA; PROBABILITY; PULSES; RADIATION PROTECTION; SURFACES; THERMONUCLEAR DEVICES; TUNGSTEN
Descriptors DEC
CARBON; CHARGED PARTICLES; ELEMENTS; EMISSION; LUMINESCENCE; METALS; MINERALS; NONMETALS; PHOTON EMISSION; REFRACTORY METALS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.