Path-reversed Auger electron and photoelectron diffraction

We propose a method for the computer simulation of Auger electron and photoelectron diffraction patterns by evaluating the amplitude of propagation paths from the detector to the electron-emitting source, justified by Helmholtz's reciprocity principle. The method offers significant computational advantages over previous schemes, and suggests an easy extension to enable the calculation of a structure-perturbation tensor for rapid crystallographic parameter variation