The effect of Yb3+ ion substitution on dielectric and microstructural properties of Y3Al5O12 ceramics
Creators
- 1. Imam Abdulrahman Bin Faisal University, Department of Physics, College of Science (Saudi Arabia)
- 2. Istanbul Sabahattin Zaim University, Departments of Software and Computer Engineering (Turkey)
- 3. Imam Abdulrahman Bin Faisal University, Department of Nano Medicine Research, Institute for Research & Medical Consultations (IRMC) (Saudi Arabia)
- 4. Imam Abdulrahman Bin Faisal University, Biophysics Department, Institute for Research & Medical Consultations (IRMC) (Saudi Arabia)
Description
The electrical and dielectric properties of Y3Al5O12 (yttrium aluminum garnet, YAG) ceramics are investigated in detail. YAG:(Yb)x (0.01 ≤ x ≤ 0.09) was synthesized by a solid state reaction and characterized by X-ray powder diffraction, field emission scanning electron microscopy, and high-resolution transmission electron microscopy. The electrical and dielectric properties have been intensively studied under certain bias voltages up to a frequency of 10 MHz. These properties are dependent on the substitution rates, independent of the bias voltages. The experimental result shows that Yb3+ ion substitution into YAG ceramics significantly influences the conductivity, dielectric constant, and lossy mechanisms, which is probably owing to the 3d-Al ions and 4f-Yb ions incorporated at different positions of structural symmetries in Y3−xYbxAl5O12 (0.00 ≤ x ≤ 0.09) ceramics.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science. Materials in Electronics
- Journal Volume
- 30
- Journal Issue
- 1
- Journal Page Range
- p. 609-623
- ISSN
- 0957-4522
- CODEN
- JSMEEV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52016840
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM IONS; CERAMICS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; NEODYMIUM LASERS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; YTTERBIUM IONS
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; IONS; LASERS; MATERIALS; MICROSCOPY; PHYSICAL PROPERTIES; SCATTERING; SOLID STATE LASERS
Optional Information
- Copyright
- Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature